Date: 14/09/2010

Rudolph recieves multiple orders for its semiconductor wafer test sysRudolph recieves multiple orders for its semiconductor wafer test sys

Rudolph technologies, developer of process control metrology systems used in semiconductor device manufacturing, has received multiple order for its semiconductor wafer test system called PrecisionWoRx VX4 Probe Card Test and Analysis Systems from a customer in Taiwan.

"Rudolph is experiencing rapid acceptance of the new VX4 Systems," said Darren James, Rudolph's product manager for the probe card test and analysis business." As probe cards become more complex and more expensive, the ability to economically test and repair them using tools such as the VX4 has become essential for both probe card manufacturers and probe card users."

The information provided by the new PrecisionWoRx VX4 tool helps to test floor managers and test engineers reduce yield losses in the probing process and extend the lifetime of probe cards. This test system also allows semiconductor manufacturers to evaluate the planarity, alignment, contact resistance, leakage current, probe force, tip wear, scrub characteristics and numerous other probe card parameters that impact probing process performance.