Date: 05/11/2009

SEMI powers IC buyers to counter chip counterfeits with new standards

SEMI has come out with new standards for semiconductor manufacturing industry to contain chip counterfeiting by validating the logistical data from non-certified distributors/suppliers. These new standards suggest use of encrypted batch numbers by the suppliers of authentic goods. The chip procurers can use free authentication service to validate the devices by feeding in encrypted batch number. Secure serialization is a major deterrent to counterfeiters- and an early warning system if theft of codes occurs.

"Counterfeit products in semiconductor manufacturing are profitable, so counterfeiters will continue to break the law. But now we have an early warning system if counterfeiting occurs," said James Amano, Director, SEMI International Standards, "so more counterfeiters will be caught and punished. Plus, reduced counterfeiting will result in increased downstream manufacturing yield and less down time."
Three other completely rewritten SEMI Standards are now available, and they include standards relevant to both the semiconductor and MEMS industries.

The new and the revised standards were developed by technical experts from equipment and materials suppliers, device manufacturers and other companies participating in the SEMI International Standards Program.

The list of new SEMI Standards includes:

SEMI T20.1 - Specification for Object Labeling to Authenticate Semiconductors and Related Products in an Open Market

SEMI T20.2 - Guide for Qualifications of Authentication Service Bodies for Detecting and Preventing Counterfeiting of Semiconductors and Related Products

SEMI E153 - Specification for AMHS SEM (AMHS SEM)

In addition to the three new standards, three SEMI Standards were completely rewritten:

SEMI MS2 - Test Method for Step Height Measurements of Thin Films

SEMI MS4 - Standard Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance

SEMI T20 - Specification for Authentication of Semiconductors and Related Products

As part of the July 2009 publication cycle, these three SEMI Standards were released:

SEMI D54 - Specification for Substrate Management of FPD Production (SMS-FPD)

SEMI E152 - Mechanical Specification of EUV POD for 150 mm EUVL Reticles

SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)


For details visit www.semi.org