Date: 31/10/2009

NVIDIA adopts Synopsys Yield Explorer to reduce time to volume

NVIDIA has adopted Synopsys' Yield Explorer solution for yield analysis and yield ramp. The Yield Explorer has ability to coherently combine and cross-correlate large volumes of data from the design, fab and test domains to quick identify dominant failure mechanisms based on TetraMAX ATPG and other advanced analysis applications.

"At NVIDIA, we face an increasingly challenging production ramp at each successive nanometer node," said Bruce Cory, manager DFx technology at NVIDIA. "We selected Yield Explorer because this solution has all the traditional yield analysis features combined with unique design-centric, volume diagnostics capabilities. Yield Explorer was able to handle gigabytes of data per day from the test floor and combine it with the design and fab data."

"IC vendors doing high-volume designs at 45 nanometers and below, like NVIDIA, see great value in consolidating all volume ramp activities in a single tool," said Howard Ko, senior vice president and general manager, Synopsys Silicon Engineering Group. "Yield Explorer uniquely combines large volumes of data with highly flexible modes of yield analysis and control, such as volume diagnostics, favored by product engineers on ASIC teams worldwide."