Date: 12/03/2025

FOX-XP from Aehr enable testing nine semiconductor wafers in parallel

Aehr Test Systems announced it has completed shipment of its first high-throughpu FOX-XP semiconductor wafer level burn-in system for an AI chip customer, delivering its high-power FOX-XP system and multiple proprietary WaferPak Contactors for production wafer level test and burn-in of advanced AI processor chips.


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