Date: 28/11/2012

Digital module by Advantest for high-speed testing of SoC interfaces

Advantest Corporation has introduced its new T2000 8GDM to address the test requirements of system-on-chip (SoC) devices with high-speed serial, parallel and memory interfaces such as PCI-Express and double data rate (DDR) connections.

The T2000 8GDM supports wide range of SoC interfaces at data rates up to 8Gbps. Key capabilities include clock and data recovery (CDR), jitter injection, I/O dead band cancellation and multi-strobe operation. The module is available in an Enhanced Performance Package (EPP) capable of functional test abstraction (FTA), which can further shorten cycle times and streamline debugging.

“With its higher density and performance, our new T2000 8GDM positions us to capture even more market share in testing complex SoC devices with high-speed interfaces in multi-time domains,” said Dr. Toshiyuki Okayasu, executive officer and executive vice president of the SoC Test Business Group at Advantest Corporation. “Both the FTA and EPP features enable system-level functional testing of these targeted semiconductors.”