Date: 15/07/2012

Teradyne's HD DPS instrument for the J750 and IP750 test platforms

Teradyne has made available of its High Density Device Power Supply (HD DPS) instrument for the J750 and IP750 test platforms. Teradyne says HD DPS instrument enables semiconductor companies to increase site count and DC measurement throughput resulting in lower cost of test for thousands of consumer digital devices including microcontroller, image sensor and standard logic devices. Teradyne said it has received multiple orders from multiple customers for the new HD DPS instrument and begun product shipments.

“The HD DPS offers our diverse set of 150+ unique customers an easy path to upgrade over 3800 J750 systems in the field with more DPS channels to increase the site count and throughput to reduce the cost of production test”

The HD DPS is available in 24- and 48-channel instrument form factors to enable configuration flexibility, each DPS channel can provide up to 1A per channel and up to 24 channels can be merged to deliver 24A to the device under test to address higher current requirements typically encountered during production test for many emerging SOC devices.

"The HD DPS offers our diverse set of 150+ unique customers an easy path to upgrade over 3800 J750 systems in the field with more DPS channels to increase the site count and throughput to reduce the cost of production test,” said Kyle Klatka, Consumer Digital Marketing manager, Teradyne. "Teradyne continues to extend instrument performance and density for the J750 and IP750 systems to address emerging technical requirements while delivering best-in-class cost of test economics for consumer digital devices."