Date: 11/07/2012

Solar modules from Kyocera withstands high-voltage stress test

Kyocera Corporation has announced that Fraunhofer Center for Silicon Photovoltaics CSP disclosed the results of its potential induced degradation (PID) test which demonstrated that Kyocera’s modules did not show any degradation after being subjected to high voltage stress testing.

Kyocera explains potential induced degradation (PID) is a phenomenon where the power output of a solar module is reduced when exposed to high negative voltage bias between the cells and ground. PID can potentially affect the performance of individual modules as well as the overall power output and efficiency of an entire solar power generating system. The resistance to, or intensity of, power output degradation in different companies’ modules can vary greatly, as shown by Fraunhofer CSP’s testing.

Earlier this year, Fraunhofer CSP anonymously acquired and independently tested modules from 13 well-known manufacturers; subjecting the modules to a high voltage stress test (50 deg. C, 50% relative humidity, -1000V, aluminum film at the front side, 48 hours). Kyocera claims it was one of only four manufacturers whose modules passed the test without showing any degradation, while other companies’ modules showed partial to significant degradation.

“As a pioneer in the industry Kyocera has been involved in R&D and manufacturing of solar power generating systems for more than 35 years, and in that time we have developed numerous innovations and manufacturing technologies to ensure the high quality and long-term durability of our products,” said Tatsumi Maeda, general manager of the Kyocera Corporate Solar Energy Group. “With Kyocera’s solar modules having been the first in the world to be certified by TUV Rheinland’s Long-Term Sequential Test, the Fraunhofer CSP test results further demonstrate the industry-leading technology and reliable performance of Kyocera modules.”