Date: 19/06/2012

FormFactor’s TrueScale Matrix platform for high parallel SoC testing

FormFactor, Inc has announced general availability of TrueScale Matrix probe cards for 200mm and 300mm full wafer contact system-on-chip, or SOC, test applications. TrueScale Matrix applies the high-parallel capabilities of SmartMatrix and TouchMatrix memory product solutions to SOC test.

For the life of the probe card, the Matrix architecture offers consistent contact performance across the full wafer. The TrueScale Matrix solution enables manufacturers of embedded memory and automotive applications to reduce the number of touchdowns per wafer, while achieving stable test over a wide temperature range. High-parallel SOC test systems can leverage the TrueScale Matrix architecture for DUT array optimization to achieve 256 DUTs in parallel capability today, with extendibility to 512 DUTs or higher.

“Rapidly increasing customer adoption of our TrueScale Matrix solution for SOC applications reinforces the benefits of stable contact, high parallelism, and improved yield demonstrated by the Matrix platform for DRAM and FLASH,” said Glenn Farris, vice president of Marketing at FormFactor. “We are investing in our Matrix architecture in close partnership with our customers to enable long term wafer test roadmaps.”

The TrueScale Matrix platform utilizes the company’s MicroSpring 3D MEMS contact technology to deliver probing performance which increases wafer test cell utilization and parallelism while improving test yields.

For more information: www.formfactor.com