Date: 04/03/2012

Test setup for fast RF verfication of TDD/FDD LTE in mobile phones

Agilent Technologies has announced a new application based on its N7300 series chipset software platform. The Agilent N7304A-2, used with the company's EXT wireless communications test set, was created in collaboration with Altair Semiconductor and optimized for high-volume manufacturing test for equipment based on Altair's FourGee 3100/6200 TDD/FDD LTE chipset.

The N7304A-2, a fully integrated and automated solution, provides fast RF calibration and verification of TDD/FDD LTE technologies for handsets, mobile devices and customer-premise equipment based on Altair's FourGee 3100/6200. The N7304A-2 leverages the measurement science and advanced sequence analyzer techniques of Agilent X-series signal analyzers.

The solution offers OEMs, ODMs, module manufacturers and design houses a reliable and efficient test solution to speed their TDD/FDD LTE devices to market.

"The test and measurement expertise we have incorporated into this solution will help device manufacturers save engineering effort and reduce the total cost of test," said Joe Depond, general manager, Agilent's Mobile Broadband Operation. "The new N7304A chipset software delivers the fastest RF parametric test solution to a wide range of Altair LTE chipset-based modules and mobile devices."

"We are very pleased with Agilent's support for our customers seeking an efficient and mature production-line test solution," said Eran Eshed, co-founder and vice president of marketing and business development at Altair. "Altair's customers are in the process of ramping up their production lines, and the capability that is now available from Agilent is essential to ensure they achieve high manufacturing yields at the lowest price and highest capacity."