Date: 13/12/2011

LED manufacturing equipment from Altatech to inspect LEDs

Altatech Semiconductor S.A. has launched AltaSight LEDMax system for detecting, classifying and characterizing defects on wafers used in manufacturing LEDs.

Altatech says its AltaSight LEDMax improves production yields for LED devices by accurately detecting process-induced defects, including those that can result during metal-organic chemical vapor deposition (MOCVD) of epitaxial layers, subsequent patterning processes and final inspection. Using Altatech's patented sensor technology that filters out all background noise, the non-contact system generates images of surface imperfections with resolution down to 1 micron and a unique depth-of-focus capability approaching 500 microns.

An integrated review station performs real-time analysis of the gathered inspection data. It can stitch together images from different perspectives, generate 3D renderings and measure defect sizes. All defect-detection results are stored within the system, and can be output to an operator in standard file formats.

"With its multi-class defect reporting and high accuracy, our newest inspection system meets the unique needs of LED manufacturers," said Jean-Luc Delcarri, president of Altatech Semiconductor. "Altatech is entering this market by providing a defect-detection solution that traditional semiconductor-inspection tools cannot match in terms of reliability and cost-efficiency."

For more info visit www.altatech-sc.com