Date: 20/03/2011

Aeroflex enhanced its PXI test sys with LTE TDD Measurement suite

Aeroflex has launched new software measurement suite for its PXI 3000 Series of modular instruments, to support the Time Division Duplex (TDD) mode of 3GPP Long Term Evolution (LTE) - also known as TD-LTE. In supporting this standard, Aeroflex says this is the industry's most comprehensive offering of low cost PXI hardware and software for multiple communications standards.

The LTE TDD Measurement Suite provides LTE TDD chipset, handset and terminal device manufacturers with comprehensive RF parametric test capability in LTE 3GPP TDD and FDD bands.

The LTE TDD Measurement Suite supports all uplink and downlink configurations including special sub-frame configuration as defined in 3GPP 36.211 section 4.2. LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs. Carrier and EVM vs. Symbol. EVM analysis for uplink signals is supported for PUSCH, SRS and PUCCH.

The new LTE TDD Measurement Suite for the PXI 3000 Series (3030 option 108)
is now available for order.