Date: 27/02/2011

PXI RF vector signal analyzer with improved performance

National Instruments (NI) has introduced the NI PXIe-5665, a 3.6 GHz RF vector signal analyzer (VSA). The advantages offered by this instrument as per NI include best-in-class RF performance and cost-effectiveness in PXI form factor.
The key features of this instrument as listed by NI include:
The new VSA features low phase noise of -129 dBc/Hz at a 10 kHz offset at 800 MHz, an average noise level of -165 dBm/Hz, a third-order intercept point of +24 dBm and absolute amplitude accuracy of ±0.10 dB.

The VSA's PXI platform also facilitates peer-to-peer streaming; includes a flexible multiple input, multiple output (MIMO) architecture for phase-coherent measurements; and offers measurement speeds that are at least five times faster than traditional rack-and-stack instruments - all of which make it ideal for demanding automated RF test applications, claims NI.

The VSA combines the new NI PXIe-5603 downconverter with the new NI PXIe-5653 local oscillator synthesizer and the NI PXIe-5622, a 150 MS/s intermediate frequency (IF) digitizer. This combination suggested as ideal solution for spectrum and wideband vector signal measurements over a frequency range from 20 Hz to 3.6 GHz with analysis bandwidths up to 50 MHz.

The VSA's onboard self-calibration tool makes it possible to achieve an IF amplitude response of ±0.15 dB and IF phase linearity of ±0.1 degree. This accuracy facilitates error vector magnitude performance of less than 0.21 percent for a 256-QAM signal.
The VSA's flexible, modular architecture expands to provide phase-coherent acquisition for MIMO test, as well as a 20 GHz/s scan rate and peer-to-peer streaming for efficient spectrum monitoring.
Additionally, engineers can operate the NI PXIe-5665 using its RF list mode function to deterministically step through a user-defined set of RF configurations using internal timing or an external trigger to significantly reduce test time.

"Not only is the NI PXIe-5665 VSA the highest performing instrument in its class, but it is available at a fraction of the cost of traditional rack-and-stack instruments," said Phil Hester, senior vice president of research and development at National Instruments. "Because our new PXI RF analyzer combines high-end performance with modular flexibility into one compact, affordable package, engineers now can use the same instrument from design to production."