Date: 13/10/2010

NI adds LTE test capability to its PXI RF test portfolio

National Instruments has launched NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. This new tool from NI adds Long Term Evolution (LTE) test capability to the company's RF test product portfolio. These test tools from NI are suitable for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a fast, flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.NI engineers will demonstrate the new LTE Measurement Suite at the 2010 4G World conference in Chicago on October 20-21.

The LTE Measurement Suite is a test system based on NI automated test software and PXI modular instrumentation. The system consists of new NI LTE Measurement Suite software, the NI PXIe-5663E 6.6 GHz vector signal analyzer, the NI PXIe-5673E 6.6 GHz vector signal generator and a PXI chassis and controller. It is reported that the LTE test system can achieve modulation accuracy measurements as low as -48 dB and perform automated measurements up to 3X and 5X faster than traditional instrumentation.

4G World attendees can view the LTE Measurement Suite demonstration and speak with National Instruments RF test engineers at booth #322.