Date: 27/07/2010

Aeroflex and Boeing SSED jointly develop 90nm RHBD digital ASICs

Aeroflex has entered into a license agreement and technology development partnership with Boeing Research & Technology's Solid State Electronics Development (SSED) for 90nm RHBD digital Application Specific Integrated Circuits (ASICs). This partnership's main focus will be to qualify the technology node for aerospace and defense applications while they develop the 45nm SOI and 32nm SOI of the RHBD library.

"Partnering with Boeing SSED and qualifying the 90nm RHBD library will leverage government investments, Boeing RHBD expertise, and nearly 30 years of Aeroflex Colorado Springs history supplying RadHard integrated circuits to the aerospace and defense communities," said Roger Van Art, Aeroflex Colorado Springs Vice President of Strategic Business. "Customers will be able to design RadHard ASICs for space applications with this ASIC family to realize significant dynamic power, cell density, and radiation-hardened performance (TID, SEE, Dose Rate) benefits. In addition, Aeroflex Colorado Springs' CAT1A Trusted accreditation in Design, Test, Assembly, and MPW Aggregation services provides customers with secure and assured access."

Warren Snapp, Boeing Research & Technology manager of SSED, said that "We are excited to support a leading developer of aerospace electronics to bring this enabling new technology to the market. It will provide aerospace systems developers with access to leading edge integrated circuits to achieve the highest performance and system effectiveness. The program will build on Boeing's 20 years of experience in developing radiation hardened circuits on leading-edge commercial fabrication processes by use of highly efficient design techniques. This partnership will leverage the strengths of each company to rapidly transition 90nm design capability to program readiness maturity and support."

The main features of the UT90nHBD include:
1. Offers radiation hardened technology from 100 krad to 1Mrad(Si) total ionizing dose (TID).
2. It's intended to provide single event upset (SEU) at over 5.0E-9 errors/bit-day, single event latchup of less than 100 MeVcm2/mg at 125degC, and dose rate upset at greater than 1.0E9 (Si)/sec.
3. All of Aeroflex's current offerings of Digital RadHard ASICs are QML Q and V qualified.

Availability: The Customer Toolkit for the UT90nHBD is available now. All QML qualification plans are scheduled to be met by 2013.

For more information visit: www.aeroflex.com/radhardASIC