Date: 14/01/2009

Long-wire ZIF probe tips for DDR, GDDR memory validation

Agilent has collaborated with Hynix Semiconductor to produce a high-bandwidth, high-performance long-wire ZIF (zero insertion force) probe tip optimized for DDR (double data rate ) and GDDR (graphics double data rate) SDRAM validation.
This product allows engineers to probe hard-to-reach locations on a DRAM chip while maintaining signal integrity. As the speed of DDR and GDDR SDRAM devices increases, and the design margins become smaller, the performance of the probing system becomes ever more critical. The long-wire ZIF tip addresses this probing challenge.

Another challenge with DDR and GDDR validation is the number of signals that need to be tested for JEDEC specifications. The design of the long-wire ZIP tip allows engineers to easily switch between the multiple signals they need to probe on a SDRAM device.

This product is compliant with testing requirements for DDR memory designs.