Date: 29/01/2010

One-button test automation solution from Tektronix spans both SATA and SAS standards

A new automated compliance and test automation solution from Tektronix, offers a simplified, one-button solution that spans both SATA and SAS (Serial Attached SCSI) standards. This new solution saves set-up time and eliminates time-consuming and repetitive manual testing.

The TekExpress software for SAS delivers physical layer transmitter and channel measurements. This eliminates the need of close monitor test specification developments. Instead, all the required tests are already fully implemented in software and instantly accessible. Automated compliance solutions for 6Gb/s SAS include the following tests:

Group1: Out of Band (OOB) Measurements
Group2: Tx Spread Spectrum Clocking (SSC) Requirements
Group 3: Tx NRZ Data Signaling Requirements and AC parametric Measurements

Tektronix offers the high-performance oscilloscopes and signal generators required for 3Gb/s SAS and 6Gb/s SAS compliance tests.

Setup and execution of SAS and SATA compliance tests is simple with TekExpress software. The test instrumentation is all controlled through the TekExpress automation framework. The TekExpress graphical user interface provides a common and intuitive workflow for setup and testing. Once the test bench is set up and the DUT is properly connected, the user simply presses the "Run" button to perform the selected SAS or SATA test suite. Detailed HTML reports and score cards are automatically generated.

"High-speed serial tests have become very complex and require the use of multiple instruments that have to be properly set up and coordinated. This complexity, together with the need for speed and efficiency, is driving a strong demand for test automation software," said Dave Slack, Marketing Manager, Technology Solutions Group, Tektronix. "In 2008, we delivered the industry's first fully automated compliance test suite for SATA Gen-2, and now we are following that up with the industry's first solution that automates the greatest combined breadth of SAS and SATA characterization tests."

Availability: Now

For more details visit www.tek.com