Date: 27/01/2010

Enhanced PXIe RF modular instruments from NI for automated wireless device test

National Instruments has introduced the NI PXIe-5663E and PXIe-5673E, a two new enhanced 6.6 GHz PXI Express RF modular vector signal analyzer (VSA)/ vector signal generator (VSG) instruments for automated wireless device test including wireless local area network (WLAN), WiMAX and GSM/EDGE/WCDMA.

The instruments' new RF list mode feature provides deterministic power and frequency sequencing functionality to make RF configuration changes more quickly during a test. Additionally, the new wide-loop bandwidth mode further improves measurement speed by reducing local oscillator settling times down to 300 microseconds or less.

"These new RF instruments illustrate our ongoing commitment to help test engineers save money by improving test times," said Eric Starkloff, vice president of test product marketing at National Instruments. "The increased performance of our enhanced 6.6 GHz RF instruments directly addresses the need to perform automated RF tests faster than traditional solutions in high-volume production applications."

The enhanced NI 6.6 GHz PXI Express RF instrumentation suite is based on the NI software-defined test platform, which incorporates PC technologies such as multicore processors and PCI Express instrument bus connectivity. The software-defined nature of the NI PXI RF modular instruments use NI LabVIEW graphical system design software to define measurement algorithms for testing a variety of wireless devices at up to five to 10 times faster than RF instrumentation.

For more details visit www.ni.com/rf/platform