Date: 29/08/2009

Agilent's in-circuit test system platform with added external circuit

Agilent has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform that offers new analog measurement technology with 12 MHz hybrid pin card, reduces the cost of test by increasing coverage.

The Series 5 ICT system addresses an array of in-circuit and functional test needs, including IEEE1149.6 boundary-scan standard testing and limited-access test applications for high complex and small-footprint boards in consumer electronics, data communication, automotive, aerospace and defense and medical applications. The test system has been able to test low-voltage components.

The Series 5 ICT system provides new infrastructures with 3 new capabilities they are,

Incorporates external circuits for added test coverage and provides better control of those circuits and reduce investment on functional testers.
Power handling capabilities for high-powered products to reduce investment on power supply hardware
Improved test throughput to increase production volumes, making more tester resources available.

Other key features are,

Two channels of high current capabilities of up to 10 A per channel
Power monitoring circuit
Fixture power supply
60 V zener testing capabilities
Digitized Measurement Circuit (DMC) with new frequency options
General-purpose relays
Flexible 1:6 multiplexed power supply channels

"Cost of test is a critical challenge for our customers," said Daniel Mak, vice president and general manager of Agilent's Measurement Systems Division. "The i3070 Series 5 enables reduction in cost of test without sacrificing any coverage. With a 20 to 30 percent ICT throughput improvement, customers can improve test efficiencies enabled by the new and improved source measurement engine in the Series 5 ICT system. And the addition of external circuits removes expensive test steps from their test processes."

Availability: Now

For more details visit www.agilent.com